Please use this identifier to cite or link to this item: http://thuvienso.dut.udn.vn/handle/DUT/5505
Title: Test-chip system for 28nm Pseudo-Ram
Authors: Lê, Minh Trí
Nguyễn, Đình Trí
Keywords: Chip system;Pseudo-Ram
Issue Date: 2019
Publisher: Trường Đại học Bách khoa - Đại học Đà Nẵng
Abstract: 
Today, the microchip industry is of prime importance, both in scale and the combination
of scientific knowledge. Digital and analog IC design is a strong development direction
in the world and in Vietnam. The application in a wide range of civilian to military sectors such as phones, computers, automated systems, industrial chains, airplanes, vehicles, etc. has spurred the circuit design to a new level.
A series of companies invest in a team of professional chip designers, optimizing in
terms of time, capacity, area and cost. As more and more chips are produced, the need
to test the features and operation of the chip after production is increasing. Investment in IC design has been more difficult and expensive than the rest of the industry, investment in microchip testing after re-design has faced many obstacles. Large-scale companies can build their own chip testing systems, but for small and medium-sized
companies, large system to test chip features is indeed a challenge.The purpose of the project is to build an automated chip testing process that can be applied on a variety of chips. Test chip processes can be automated, users can easily
check the chip's features with the given cases. The project aims to optimize, minimize the cost of a chip test system by using hardware design on FPGAs and computer software.
Description: 
60 Tr.
URI: http://thuvienso.dut.udn.vn/handle/DUT/5505
Appears in Collections:DA.Hệ thống nhúng

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